On-chip test comparison for protecting confidential data in secure ICs - researchr publication authors

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Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. On-chip test comparison for protecting confidential data in secure ICs. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1, IEEE Computer Society, 2012. [doi]

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