Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. On-chip test comparison for protecting confidential data in secure ICs. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1, IEEE Computer Society, 2012. [doi]
@inproceedings{DaRoltNFR12,
title = {On-chip test comparison for protecting confidential data in secure ICs},
author = {Jean DaRolt and Giorgio Di Natale and Marie-Lise Flottes and Bruno Rouzeyre},
year = {2012},
doi = {10.1109/ETS.2012.6233039},
url = {http://dx.doi.org/10.1109/ETS.2012.6233039},
researchr = {https://researchr.org/publication/DaRoltNFR12},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-0697-3},
}