Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. On-chip test comparison for protecting confidential data in secure ICs. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1, IEEE Computer Society, 2012. [doi]
Abstract is missing.