Chenghu Dai, Yuanyuan Du, Qi Shi, Ruixuan Wang, Hao Zheng, Wenjuan Lu, Chunyu Peng, Licai Hao, Zhiting Lin, Xiulong Wu. Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design. Microelectronics Journal, 132:105699, February 2023. [doi]
Abstract is missing.