Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design - researchr publication related

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Chenghu Dai, Yuanyuan Du, Qi Shi, Ruixuan Wang, Hao Zheng, Wenjuan Lu, Chunyu Peng, Licai Hao, Zhiting Lin, Xiulong Wu. Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design. Microelectronics Journal, 132:105699, February 2023. [doi]

The following publications are possibly variants of this publication:

Bitline Leakage Current Compensation Circuit for High-Performance SRAM DesignRuixing Lu, Na Bai, Baitao Lv, Jiafeng Zhu, Xiulong Wu. nas 2012: 109-113 [doi]

A current mode sense amplifier with self-compensation circuit for SRAM applicationHeqing Xu, Song Jia, Jiyu Chen, Yuan Wang, Gang Du. asicon 2013: 1-4 [doi]

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