Aliasing errors in signature analysis testing of integrated circuits

Maurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò. Aliasing errors in signature analysis testing of integrated circuits. In Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988. pages 458-461, IEEE, 1988. [doi]

Abstract

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