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Tejasvi Das, Anand Gopalan, Clyde Washburn, Ponnathpur R. Mukund. Self-calibration of input-match in RF front-end circuitry. IEEE Trans. on Circuits and Systems, 52-II(12):821-825, 2005. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitryTejasvi Das, P. R. Mukund. date 2007: 1277-1282 [doi] A current based self-test methodology for RF front-end circuitsAnand Gopalan, Martin Margala, P. R. Mukund. mj, 36(12):1091-1102, 2005. [doi]
The following publications are possibly variants of this publication: