New digital circuit techniques for total standby leakage reduction in nano-scale SOI technology - researchr publication authors

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Koushik K. Das, Rajiv V. Joshi, Ching-Te Chuang, Peter W. Cook, Richard B. Brown. New digital circuit techniques for total standby leakage reduction in nano-scale SOI technology. In José E. Franca, Rudolf Koch, editors, ESSCIRC 2003 - 29th European Solid-State Circuits Conference, Estoril, Portugal, September 16-18, 2003. pages 309-312, IEEE, 2003. [doi]

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