Koushik K. Das, Rajiv V. Joshi, Ching-Te Chuang, Peter W. Cook, Richard B. Brown. New digital circuit techniques for total standby leakage reduction in nano-scale SOI technology. In José E. Franca, Rudolf Koch, editors, ESSCIRC 2003 - 29th European Solid-State Circuits Conference, Estoril, Portugal, September 16-18, 2003. pages 309-312, IEEE, 2003. [doi]
@inproceedings{DasJCCB03-0,
title = {New digital circuit techniques for total standby leakage reduction in nano-scale SOI technology},
author = {Koushik K. Das and Rajiv V. Joshi and Ching-Te Chuang and Peter W. Cook and Richard B. Brown},
year = {2003},
doi = {10.1109/ESSCIRC.2003.1257134},
url = {https://doi.org/10.1109/ESSCIRC.2003.1257134},
researchr = {https://researchr.org/publication/DasJCCB03-0},
cites = {0},
citedby = {0},
pages = {309-312},
booktitle = {ESSCIRC 2003 - 29th European Solid-State Circuits Conference, Estoril, Portugal, September 16-18, 2003},
editor = {José E. Franca and Rudolf Koch},
publisher = {IEEE},
isbn = {0-7803-7995-0},
}