Nonlinear CA Based Design of Test Set Generator Targeting Pseudo-Random Pattern Resistant Faults - researchr publication authors

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Sukanta Das, Anirban Kundu, Biplab K. Sikdar. Nonlinear CA Based Design of Test Set Generator Targeting Pseudo-Random Pattern Resistant Faults. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 196-201, IEEE Computer Society, 2004. [doi]

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