Sukanta Das, Anirban Kundu, Biplab K. Sikdar. Nonlinear CA Based Design of Test Set Generator Targeting Pseudo-Random Pattern Resistant Faults. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 196-201, IEEE Computer Society, 2004. [doi]
@inproceedings{DasKS04,
title = {Nonlinear CA Based Design of Test Set Generator Targeting Pseudo-Random Pattern Resistant Faults},
author = {Sukanta Das and Anirban Kundu and Biplab K. Sikdar},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350196abs.htm},
tags = {testing, random testing, design},
researchr = {https://researchr.org/publication/DasKS04},
cites = {0},
citedby = {0},
pages = {196-201},
booktitle = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2235-1},
}