Sukanta Das, Anirban Kundu, Biplab K. Sikdar. Nonlinear CA Based Design of Test Set Generator Targeting Pseudo-Random Pattern Resistant Faults. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 196-201, IEEE Computer Society, 2004. [doi]
Abstract is missing.