Accurate sensor readout circuitry for reliability measurement of hermetically sealed chip-scale biomedical implants

Kushal Das, Torsten Lehmann, Cesar Rodrigues. Accurate sensor readout circuitry for reliability measurement of hermetically sealed chip-scale biomedical implants. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 325-328, IEEE, 2013. [doi]

Authors

Kushal Das

This author has not been identified. Look up 'Kushal Das' in Google

Torsten Lehmann

This author has not been identified. Look up 'Torsten Lehmann' in Google

Cesar Rodrigues

This author has not been identified. Look up 'Cesar Rodrigues' in Google