Kushal Das, Torsten Lehmann, Cesar Rodrigues. Accurate sensor readout circuitry for reliability measurement of hermetically sealed chip-scale biomedical implants. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 325-328, IEEE, 2013. [doi]
@inproceedings{DasLR13,
title = {Accurate sensor readout circuitry for reliability measurement of hermetically sealed chip-scale biomedical implants},
author = {Kushal Das and Torsten Lehmann and Cesar Rodrigues},
year = {2013},
doi = {10.1109/MWSCAS.2013.6674651},
url = {https://doi.org/10.1109/MWSCAS.2013.6674651},
researchr = {https://researchr.org/publication/DasLR13},
cites = {0},
citedby = {0},
pages = {325-328},
booktitle = {IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013},
publisher = {IEEE},
}