Kushal Das, Torsten Lehmann, Cesar Rodrigues. Accurate sensor readout circuitry for reliability measurement of hermetically sealed chip-scale biomedical implants. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 325-328, IEEE, 2013. [doi]
Abstract is missing.