Crosstalk and Gate Oxide Reliability Analysis in Graphene Nanoribbon Interconnects - researchr publication authors

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Debaprasad Das, Hafizur Rahaman. Crosstalk and Gate Oxide Reliability Analysis in Graphene Nanoribbon Interconnects. In International Symposium on Electronic System Design, ISED 2011, Kochi, Kerala, India, December 19-21, 2011. pages 182-187, IEEE, 2011. [doi]

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