A SoC Test Strategy Based on a Non-Scan DFT Method

Hiroshi Date, Toshinori Hosokawa, Michiaki Muraoka. A SoC Test Strategy Based on a Non-Scan DFT Method. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 305-310, IEEE Computer Society, 2002. [doi]

Abstract

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