Hiroshi Date - researchr alias

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Viewing Publication 1 - 14 from 14

2021

Deformation analysis of surface and bronchial structures in intraoperative pneumothorax using deformable mesh registrationMegumi Nakao, Kotaro Kobayashi, Junko Tokuno, Toyofumi Chen-Yoshikawa, Hiroshi Date, Tetsuya Matsuda. mia, 73:102181, 2021. [doi]

2019

Surface deformation analysis of collapsed lungs using model-based shape matchingMegumi Nakao, Junko Tokuno, Toyofumi Chen-Yoshikawa, Hiroshi Date, Tetsuya Matsuda. cars, 14(10):1763-1774, 2019. [doi]

2008

Effects of At-Home Nursing Service Scheduling in Multiagent SystemsHiroshi Date, Tokuro Matsuo. In Ngoc Thanh Nguyen, Radoslaw Katarzyniak, editors, New Challenges in Applied Intelligence Technologies. Volume 134 of Studies in Computational Intelligence, pages 245-254, Springer, 2008. [doi]

2004

A DFT Selection Method for Reducing Test Application Time of System-on-ChipsMasahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara. ieicet, 87-D(3):609-619, 2004. [doi]

2003

A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area ConstraintToshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara. ats 2003: 130-135 [doi]

A DFT Selection Method for Reducing Test Application Time of System-on-ChipsMasahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara. ats 2003: 412-417 [doi]

2002

A SoC Test Strategy Based on a Non-Scan DFT MethodHiroshi Date, Toshinori Hosokawa, Michiaki Muraoka. ats 2002: 305-310 [doi]

A Test Generation Method Using a Compacted Test Table and a Test Generation Method Using a Compacted Test Plan Table for RTL Data Path CircuitsToshinori Hosokawa, Hiroshi Date, Michiaki Muraoka. vts 2002: 328-335 [doi]

A State Reduction Method for Non-Scan Based FSM Testing with Don t Care Inputs Identification TechniqueToshinori Hosokawa, Hiroshi Date, Michiaki Muraoka. ats 2002: 55-60 [doi]

2000

Mathematical Modeling of Intellectual Property Protection Using Partially-Mergeable CoresHiroshi Date, Vikram Iyengar, Krishnendu Chakrabarty, Makoto Sugihara. pdpta 2000:

Analysis and Minimization of Test Time in a Combined BIST and External Test ApproachMakoto Sugihara, Hiroto Yasuura, Hiroshi Date. date 2000: 134-140 [doi]

1998

A novel test methodology for core-based system LSIs and a testing time minimization problemMakoto Sugihara, Hiroshi Date, Hiroto Yasuura. itc 1998: 465 [doi]

1995

A parallel sequential test generation system DESCARTES based on real-valued logic simulationHiroshi Date, Michinobu Nakao, Kazumi Hatayama. ats 1995: 252-258 [doi]

1992

LSI-CAD Programs on Parallel Inference MachineHiroshi Date, Yukinori Matsumoto, Kouichi Kimura, Kazuo Taki, Hiroo Kato, Masahiro Hoshi. fgcs 1992: 237-247

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