Toshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara. A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 130-135, IEEE Computer Society, 2003. [doi]
Abstract is missing.