Toshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara. A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 130-135, IEEE Computer Society, 2003. [doi]
@inproceedings{HosokawaDMMF03,
title = {A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint},
author = {Toshinori Hosokawa and Hiroshi Date and Masahide Miyazaki and Michiaki Muraoka and Hideo Fujiwara},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510130abs.htm},
tags = {testing, constraints},
researchr = {https://researchr.org/publication/HosokawaDMMF03},
cites = {0},
citedby = {0},
pages = {130-135},
booktitle = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-1951-2},
}