A DFT Selection Method for Reducing Test Application Time of System-on-Chips

Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara. A DFT Selection Method for Reducing Test Application Time of System-on-Chips. IEICE Transactions, 87-D(3):609-619, 2004. [doi]

Abstract

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