Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara. A DFT Selection Method for Reducing Test Application Time of System-on-Chips. IEICE Transactions, 87-D(3):609-619, 2004. [doi]
No references recorded for this publication.
No citations of this publication recorded.