Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology

Animesh Datta, Mohamed H. Abu-Rahma, Sachin Dileep Dasnurkar, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu. Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 580-584, IEEE, 2013. [doi]

Abstract

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