A Scheme for On-Chip Timing Characterization

Ramyanshu Datta, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham. A Scheme for On-Chip Timing Characterization. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 24-29, IEEE Computer Society, 2006. [doi]

Authors

Ramyanshu Datta

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Gary D. Carpenter

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Kevin J. Nowka

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Jacob A. Abraham

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