Ramyanshu Datta, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham. A Scheme for On-Chip Timing Characterization. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 24-29, IEEE Computer Society, 2006. [doi]
@inproceedings{DattaCNA06,
title = {A Scheme for On-Chip Timing Characterization},
author = {Ramyanshu Datta and Gary D. Carpenter and Kevin J. Nowka and Jacob A. Abraham},
year = {2006},
doi = {10.1109/VTS.2006.11},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.11},
researchr = {https://researchr.org/publication/DattaCNA06},
cites = {0},
citedby = {0},
pages = {24-29},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}