Ramyanshu Datta, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham. A Scheme for On-Chip Timing Characterization. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 24-29, IEEE Computer Society, 2006. [doi]
Abstract is missing.