Bulent I. Dervisoglu, Gayvin E. Stong. Design for Testability: Using Scanpath Techniques for Path-Delay Test and Measurement. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 365-374, IEEE Computer Society, 1991.
Abstract is missing.