Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage

V. R. Devanathan. Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 300-305, IEEE Computer Society, 2005. [doi]

Authors

V. R. Devanathan

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