Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage

V. R. Devanathan. Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 300-305, IEEE Computer Society, 2005. [doi]

Abstract

Abstract is missing.