V. R. Devanathan. Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 300-305, IEEE Computer Society, 2005. [doi]
@inproceedings{Devanathan05,
title = {Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage},
author = {V. R. Devanathan},
year = {2005},
doi = {10.1109/ATS.2005.82},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.82},
tags = {architecture, partitioning, coverage},
researchr = {https://researchr.org/publication/Devanathan05},
cites = {0},
citedby = {0},
pages = {300-305},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}