SEU-Hardened Dual Data Rate Flip-Flop Using C-Elements

Srikanth V. Devarapalli, Payman Zarkesh-Ha, Steven C. Suddarth. SEU-Hardened Dual Data Rate Flip-Flop Using C-Elements. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 167-171, IEEE Computer Society, 2010. [doi]

Authors

Srikanth V. Devarapalli

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Payman Zarkesh-Ha

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Steven C. Suddarth

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