Srikanth V. Devarapalli, Payman Zarkesh-Ha, Steven C. Suddarth. SEU-Hardened Dual Data Rate Flip-Flop Using C-Elements. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 167-171, IEEE Computer Society, 2010. [doi]
Abstract is missing.