Narendra Devta-Prasanna, Sandeep Kumar Goel. Small-Delay Defect Coverage Metrics. In Sandeep Kumar Goel, Krishnendu Chakrabarty, editors, Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. pages 185-210, CRC Press, 2014.
@incollection{Devta-PrasannaG14,
title = {Small-Delay Defect Coverage Metrics},
author = {Narendra Devta-Prasanna and Sandeep Kumar Goel},
year = {2014},
researchr = {https://researchr.org/publication/Devta-PrasannaG14},
cites = {0},
citedby = {0},
pages = {185-210},
booktitle = {Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits},
editor = {Sandeep Kumar Goel and Krishnendu Chakrabarty},
publisher = {CRC Press},
isbn = {978-1-439-82941-7},
}