Pseudorandom BIST for test and characterization of linear and nonlinear MEMS - researchr publication authors

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Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur, Emmanuel Simeu. Pseudorandom BIST for test and characterization of linear and nonlinear MEMS. Microelectronics Journal, 40(7):1054-1061, 2009. [doi]

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