Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur, Emmanuel Simeu. Pseudorandom BIST for test and characterization of linear and nonlinear MEMS. Microelectronics Journal, 40(7):1054-1061, 2009. [doi]
@article{DhayniMRBS09,
title = {Pseudorandom BIST for test and characterization of linear and nonlinear MEMS},
author = {Achraf Dhayni and Salvador Mir and Libor Rufer and Ahcène Bounceur and Emmanuel Simeu},
year = {2009},
doi = {10.1016/j.mejo.2008.05.012},
url = {http://dx.doi.org/10.1016/j.mejo.2008.05.012},
tags = {testing},
researchr = {https://researchr.org/publication/DhayniMRBS09},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {40},
number = {7},
pages = {1054-1061},
}