Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements - researchr publication authors

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Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler. Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements. In IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019. pages 1-4, IEEE, 2019. [doi]

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