Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler. Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements. In IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{DhotreED19,
title = {Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements},
author = {Harshad Dhotre and Stephan Eggersglüß and Rolf Drechsler},
year = {2019},
doi = {10.1109/LATW.2019.8704618},
url = {https://doi.org/10.1109/LATW.2019.8704618},
researchr = {https://researchr.org/publication/DhotreED19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1756-0},
}