Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler. Machine learning based test pattern analysis for localizing critical power activity areas. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.