A 350μW Sign-Bit architecture for multi-parameter estimation during OFDM acquisition in 65nm CMOS - researchr publication authors

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Isael Diaz, Siyu Tan, Yun Miao, Leif R. Wilhelmsson, Ove Edfors, Viktor Öwall. A 350μW Sign-Bit architecture for multi-parameter estimation during OFDM acquisition in 65nm CMOS. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2984-2987, IEEE, 2015. [doi]

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