Isael Diaz, Siyu Tan, Yun Miao, Leif R. Wilhelmsson, Ove Edfors, Viktor Öwall. A 350μW Sign-Bit architecture for multi-parameter estimation during OFDM acquisition in 65nm CMOS. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2984-2987, IEEE, 2015. [doi]
@inproceedings{DiazTMWEO15,
title = {A 350μW Sign-Bit architecture for multi-parameter estimation during OFDM acquisition in 65nm CMOS},
author = {Isael Diaz and Siyu Tan and Yun Miao and Leif R. Wilhelmsson and Ove Edfors and Viktor Öwall},
year = {2015},
doi = {10.1109/ISCAS.2015.7169314},
url = {http://dx.doi.org/10.1109/ISCAS.2015.7169314},
researchr = {https://researchr.org/publication/DiazTMWEO15},
cites = {0},
citedby = {0},
pages = {2984-2987},
booktitle = {2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8391-9},
}