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The Invariance of Characteristic Current Densities in Nanoscale MOSFETs and Its Impact on Algorithmic Design Methodologies and Design Porting of Si(Ge) (Bi)CMOS High-Speed Building Blocks

Timothy O. Dickson, Kenneth H. K. Yau, Theodoros Chalvatzis, Alain M. Mangan, Ekaterina Laskin, Rudy Beerkens, Paul Westergaard, Mihai Tazlauanu, Ming-Ta Yang, Sorin P. Voinigescu. The Invariance of Characteristic Current Densities in Nanoscale MOSFETs and Its Impact on Algorithmic Design Methodologies and Design Porting of Si(Ge) (Bi)CMOS High-Speed Building Blocks. J. Solid-State Circuits, 41(8):1830-1845, 2006. [doi]

Authors

Timothy O. Dickson

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Kenneth H. K. Yau

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Theodoros Chalvatzis

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Alain M. Mangan

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Ekaterina Laskin

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Rudy Beerkens

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Paul Westergaard

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Mihai Tazlauanu

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Ming-Ta Yang

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Sorin P. Voinigescu

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