Timothy O. Dickson, Kenneth H. K. Yau, Theodoros Chalvatzis, Alain M. Mangan, Ekaterina Laskin, Rudy Beerkens, Paul Westergaard, Mihai Tazlauanu, Ming-Ta Yang, Sorin P. Voinigescu. The Invariance of Characteristic Current Densities in Nanoscale MOSFETs and Its Impact on Algorithmic Design Methodologies and Design Porting of Si(Ge) (Bi)CMOS High-Speed Building Blocks. J. Solid-State Circuits, 41(8):1830-1845, 2006. [doi]
Abstract is missing.