Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri. Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 250-255, IEEE Computer Society, 2003. [doi]
Abstract is missing.