Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan. Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 266-271, IEEE Computer Society, 2004. [doi]
Abstract is missing.