Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan. Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution. In 9th European Test Symposium (ETS 2004), May 23-26, 2004, Ajaccio, France. pages 140-145, IEEE, 2004. [doi]
Abstract is missing.