Giorgos Dimitrakopoulos, Dimitris Nikolos, Dimitris Bakalis. Bit-Serial Test Pattern Generation by an Accumulator Behaving as a Non-Linear Feedback Shift Register. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 152-157, IEEE Computer Society, 2002. [doi]
Abstract is missing.