Akis Doganis, James C. Chen. Interconnect Simple, Accurate and Statistical Models Using On-Chip Measurements for Calibration. In 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India. pages 120-127, IEEE Computer Society, 1999.
@inproceedings{DoganisC99,
title = {Interconnect Simple, Accurate and Statistical Models Using On-Chip Measurements for Calibration},
author = {Akis Doganis and James C. Chen},
year = {1999},
tags = {C++},
researchr = {https://researchr.org/publication/DoganisC99},
cites = {0},
citedby = {0},
pages = {120-127},
booktitle = {12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India},
publisher = {IEEE Computer Society},
}