Interconnect Simple, Accurate and Statistical Models Using On-Chip Measurements for Calibration - researchr publication

researchr

You are not signed in
Sign in
Sign up

Akis Doganis, James C. Chen. Interconnect Simple, Accurate and Statistical Models Using On-Chip Measurements for Calibration. In 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India. pages 120-127, IEEE Computer Society, 1999.

Abstract is missing.

runs on WebDSL