Interconnect Simple, Accurate and Statistical Models Using On-Chip Measurements for Calibration - researchr publication references

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Akis Doganis, James C. Chen. Interconnect Simple, Accurate and Statistical Models Using On-Chip Measurements for Calibration. In 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India. pages 120-127, IEEE Computer Society, 1999.

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