Characterization of vertically aligned carbon nanofibers grown on Ni dots nanoelectrode array using Atomic Force Microscopy - researchr publication related

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Zhuxin Dong, Uchechukwu C. Wejinya, Imad H. Elhajj, M. Meyyappan. Characterization of vertically aligned carbon nanofibers grown on Ni dots nanoelectrode array using Atomic Force Microscopy. In 2009 IEEE/RSJ International Conference on Intelligent Robots and Systems, October 11-15, 2009, St. Louis, MO, USA. pages 1861-1866, IEEE, 2009. [doi]

The following publications are possibly variants of this publication:

Scanning and measurement of carbon nanofiber nanoelectrode arrays using Atomic Force MicroscopyZhuxin Dong, Uchechukwu C. Wejinya, Holly D. Tourtillott, Imad H. Elhajj, M. Meyyappan. robio 2009: 1-6 [doi]

Characterization of etched and Unetched Vertically Aligned Carbon Nanofibers (VACNFs) using Atomic Force MicroscopySiva Naga Sandeep Chalamalasetty, Uchechukwu C. Wejinya, Zhuxin Dong. iros 2010: 5786-5791 [doi]

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